Analysis of ordinal modeling of multi-stage reliability growth with instant and delayed fix modes

YAN Zhi-qiang,LI Xin-xin,XIE Hong-wei
DOI: https://doi.org/10.7495/j.issn.1009-3486.2009.02.009
2009-01-01
Abstract:In the multi-stage reliability growth test with instant and delayed fix modes,the test data at different stages can be assumed to follow the Weibull processes with different parameters.With only a few field samples,there are some difficulties in using the traditional reliability evaluation methods.Based on the estimation of stages′ shape parameters,an ordinal constraint relationship was constructed on the failure intensities at different stages′ truncated times,thus to obtain the expectation and upper limit of the failure intensity at the last stage′s truncated time with Bayesian method combining the prior information.By means of the previous stages′ data,this method was proved to be better than the classic method which only considers the single stage data.Therefore,it can be used to implement the synthetic evaluation of multi-stage reliability growth test.
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