X-ray Automatic Inspection Techniques for Carbon Product Defects

Xian ZHOU,Yi-lun LIU
DOI: https://doi.org/10.3321/j.issn:1004-924x.2006.03.031
2006-01-01
Optics and Precision Engineering
Abstract:Based on the characteristic of X-ray detection images of carbon product,the defect extraction and recognition techniques were present to remove background and enhance image successfully with target boundary extraction algorithm and image enhancement algorithm on wavelet transform.In order to eliminate the effect of noise,a mathematical morphology combining with iteration threshold segmentation method was adopted to extract defect from a image without background,it was proved to be very effective.An algorithm based on genetic strategy and BP neural network is proposed for the selection and recognition of defects,the results show that the veracity of defects recognition is 95%.These techniques are then combined into an automatic inspection system for carbon material.
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