Abstract:X-ray spectrograph has long been used as a means of diagnosing conditions of laser-produced plasmas, as information concerning both the temperature and density can be extracted from the emitted radiation. For the measurement of X-ray lines in the energy range of 0.6-6 keV, A curved crystal X-ray spectrometer of reflection type elliptical geometry is required. In order to obtain both high resolution and collection efficiency the elliptical geometry is more advantageous than the flat configurations. Elliptical curved crystals spectrograph with a relatively wide spectral range are of particular use for deducing electron temperatures by measurement of the ratios of lines associated with different charge states. Curved crystals analyzer was designed and manufactured for use on an experiment to investigate the properties of laser produced plasmas. The spectrograph has 1350mm focal length and for these measurements, utilized PET, LIF, KAP and MICA crystal bent onto an elliptical substrate. This crystal analyzer covers the Bragg angel range from 30 to 67.5. The analyzer based on elliptically geometrical principle, which has self-focusing characteristics. The experiment was carried out on Shanghai Shengguang-II Facility and aimed to investigate the characteristics of a high density plasma. Experimental results using Curved crystal analyzer are described which show spectrum of Ti, Au laser-plasma. The focusing crystal analyzer clearly gave an increase in sensitivity over a flat crystal. Spectra showing the main resonance line were recorded with X-ray CCD and with laser energies 150J laser wavelength 350nm. The calculated wavelength resolution is about 500-1000.

Research and development of a spherical bent crystal analyzer

X-ray Imaging Diagnosis Using Spherically Bent Crystal Analyzer

Spherically bent crystal spectroscopy in laser-produced plasma

Application of Spherically Bent Crystal to X-ray Backlight Imaging Experiment

Application of Spherically Bent Crystals Spectrometer to X-ray Diagnosis

X-ray Spectral Diagnosis for Laser Plasma

Simulation and Experimental Research of X-Ray Toroidally Bent Crystal Imaging with Laser-Produced Plasma

Research of X-ray Curved Crystals Analyzer

Research on the monochromatic X-ray imaging with spherically bent crystal

Research of elliptical curved crystal analyzer for diagnostic X-ray spectrum

Research and development of X-ray imaging system based on novel bent crystal

Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray

Double-spherically Bent Crystal High-Resolution X-ray Spectroscopy of Spatially Extended Sources

High-resolution X-ray Focusing Concave (elliptical) Curved Crystal Spectrograph for Laser-Produced Plasma

Diagnosis of X-ray Spectrum of Z-pinch Plasma with Mica Curved Crystal Spectrometer

Curved Crystal Spectrometer for the Measurement of X-Ray Lines from Laser-Produced Plasmas

Design of elliptical crystal spectrograph analyzer

Elliptical Crystal Spectrometer for Gas-puff-Pinch Plasma X-Ray

Analysis and Implementation of Toroidally Bent Crystal for X-ray Imaging Technology

Elliptical Crystal Spectrometer Designed for Laser-Produced Plasma X-Ray

Application of curved crystal spectrometer in measuring X-ray line