Effects of Al on the failure mechanism of the Sn–Ag–Zn eutectic solder

C. Wei,Y.C. Liu,L.M. Yu,H. Chen,X. Wang
DOI: https://doi.org/10.1016/j.microrel.2010.04.023
IF: 1.6
2010-01-01
Microelectronics Reliability
Abstract:Tensile testing of Sn–3.7Ag–0.9Zn–xAl (x=0, 0.5 and 1.0wt.%) solders have been performed and the failure mechanism was investigated. The results suggest that the addition of Al in the Sn–3.7Ag–0.9Zn solder decreases both the tensile strength and ductility. Moreover, a brittle fracture occurs instead of a ductile fracture with increasing Al content. The fractographs suggest that the fracture mechanism of Sn–Ag–Zn eutectic solder is microvoid coalescence fracture, and the Sn–3.7Ag–0.9Zn–xAl (x=0.5 and 1.0) solder corresponds to quasi-cleavage crack and cleavage fracture respectively.
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