Periodic Ferrite–semiconductor Layered Composite with Negative Index of Refraction

Rui-Xin Wu,Tianen Zhao,John Q. Xiao
DOI: https://doi.org/10.1088/0953-8984/19/2/026211
2007-01-01
Abstract:We have studied the index of refraction of periodic layered semiconductor–ferrite composite. Both the transmission matrix analysis and full-wave simulations confirm the existence of a negative index of refraction in the composite. We find that the magnitude of the negative index of refraction and its frequency range depend on the ratio of the semiconductor and ferrite layer thicknesses and the doping content of the semiconductor. At the long-wave approximation, we have obtained the explicit expression of the effective index of refraction, effective permittivity and effective permeability. The result shows that it is possible to fabricate a uniform negative index material with the layered composite.
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