Situation Registration Based on Genetic Algorithm in LED Chip Testing System

石炜,郗安民,董占民
DOI: https://doi.org/10.3969/j.issn.1008-0570.2008.34.115
2008-01-01
Abstract:Aim at the particularity of situation Registration in LED chip testing system, the adaptive location registration model i built. It puts forward a method of step by step calculate and the parameter is optimized by genetic algorithm. This method can re solve the question of non-linear in normal method. The result show this model and solution fulfill the demand of situation registration in LED chip testing system. The calculation is simple and is prone to gain the numerical value solution. The developed method ha the advantages of simple constitution, real time on line measurement, no contact and high precision and has great significance in oth er image model parameter solution.
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