Analysis on Resistance of Wheat Germplasms by GIS to Sitobion Avenae F.

WANG Chun-ping,LUO Ku,ZHU Qi-di,LI Dan,ZHAO Hui-yan,ZHANG Gai-sheng
DOI: https://doi.org/10.13207/j.cnki.jnwafu.2011.04.018
2011-01-01
Abstract:【Objective】 Breeders have explored and found new and high wheat germplasms for resistance to S.avenae and method,providing theoretical basis and technical support for efficient and environment-friendly wheat breeding.【Method】 In this paper,based on the GIS spatial distribution analysis and identification of the wheat germplasms for resistance,13 main traits of 22 wheat germplasms from 377 wheat germplasms were analyzed by the grey system theory.【Result】 The GIS spatial distribution analysis result indicated that damages of S.avenae population to the wheat germplasms were from the damages of invasion to the damages of aggregation.From the field trait to the inoculate experiment analysis,the results showed that in 377 wheat germplasms,4 high resistance wheat germplasms which occupied 1.06% of the material respectively were Shaan 253,Yumai 70,Shaannuo 1,186Tm;55 moderate resistance wheat germplasms occupied 14.59%,including Amigo,98-10-35,Xiaoyan 22,PI gao,and 113 low resistance wheat germplasms were 29.97%.The gray theoretical analysis showed that the orders of alternatives ranks were as follows: resistant scalesinfertile spikeletspike lengthseed plumpnessspikes number per plantfertile spikeletuniformity degreeseed number per spikeplant heightgrain weight per plantstem length under spikeneck length.【Conclusion】 Wheat germplasms resistance to S.avenae was evaluated comprehensively by GIS spatial distribution analysis,aphid index and grey system analysis,at the same time,it was concluded that some wheat germplasms had high resistance materials and obtained some main agronomic traits related with resistance.
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