Conductive Porphyrin Films Prepared by the Self-Assembly Method

XQ Zhang,HM Wu,ZH Lu,XZ You
DOI: https://doi.org/10.1016/s0040-6090(95)08310-3
IF: 2.1
1996-01-01
Thin Solid Films
Abstract:This paper describes the preparation, characterization and conductivity of the self-assembly films of two newly synthesized bridged-porphyrins [FeTPPCN]n and [CoTPPpz]n. The bridged-porphyrins are bonded covalently to the gold surface or the foundational film surface on the gold substrate. The films are characterized by Auger electron spectroscopy and X-ray photoelectron spectroscopy. Raman studies reveal that the long axis of the CN-porphyrin is perpendicular to the surface and that of pyrazine-porphyrin tilts on the surface. The conductivity in the film normal direction is 9.1 × 10−4 S cm−1 and 3.8 × 10−4 S cm−1 respectively for [FeTPPCN]n and [CoTPPpz]n after doping with iodine.
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