Resistance Evaluation of RILs Developed from a Synthetic Wheat Syn-CD 780 × T. Aestivum L. Cv. Chuanyu 12 to Chinese New Stripe Rust Race CYR32

汤永禄,杨武云,曾云超,李朝苏,彭云良,邹裕春,陈放
DOI: https://doi.org/10.3969/j.issn.1001-4829.2007.02.019
2007-01-01
Abstract:Stripe rust,caused by Puccinia striiformis West.,is a worldwide wheat disease and one of the greatest constraints to wheat production of Sichuan province,China.With the purpose of identifying and utilizing genes for resistance to the disease,a population of 131 F8 recombinant inbred lines developed from a synthetic wheat Syn-CD780×T.aestivum L.cv.Chuanyu12 was visually evaluated for seedling and adult-plant resistance to Chinese new stripe rust race CYR32 during 2004-2006.The results illustrated the 3∶1 and 9∶7 segregation ratios for the pooled resistant vs.susceptible line classes,respectively.It could be drawn from this analysis that the resistance at seedling of Syn-780 to CYR32 was controlled by one dominant gene and the resistance at adult-pant resistance to the same stripe rust race was controlled by two complementary dominant genes.The synthetics Syn-CD780 can be used as resistant germplasm resource for wheat breeding in China.
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