RFID tag automation test system

Zhao Jinjin,Qin Honglei
DOI: https://doi.org/10.3969/j.issn.1002-7300.2013.04.001
2013-01-01
Abstract:In order to achieve the automatic test of the performance of RF tags and readers under the premise of high precision and high speed of response,this paper builds a radio-frequency-identification tag automatic test system,which based on virtual instruments and LabVIEW as a software developer,and National Instruments PXI hardware platform.The system achieves the automatic test of RF tags’ and readers’ performance and data access flow with good human-computer interaction,stable and reliable operation greatly reduced test time and improved efficiency.LabVIEW FPGA and R Series hardware used in combination not only combines the advantages of the FPGA but also retains the traditional data features of acquisition,processing and communication.
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