The Number and Surviral Rate of Corn Root Border Cells under the Stress of Copper Ions

刘婷婷,李锋,张曦,施积炎,陈英旭
DOI: https://doi.org/10.13592/j.cnki.ppj.2012.07.005
2012-01-01
Abstract:By using the hanging air culture and in vitro culture with different concentrations of copper ions stress,we observed the changes of corn root border cells’s shape,numbers and survival rates.The result showed that,when the corn root was 32 mm,the number of border cells reached a maximum of 4 125,but its survival rate was the lowest at this time.The number of border cells showed some changes accompany with the copper ions increased.When the copper concentration was 50 μmol.L-1,the number of dead border cells reached 758(the survival rate was 24.80%).Followed by the concentration of copper ions increased to 100 μmol.L-1,the survival rate declined 17.54%.The number of corn root border cells were showed an gradually reducing trend with the increase of the concentration of copper ions,the surviral rate decreased gradually.Thus,under the stress of the copper ions,the release of root border cells played the role of protection the rhizosphere region.
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