In situ high temperature X-ray diffraction studies of mixed ionic and electronic conducting perovskite-type membranes

Haihui Wang,Cristina Tablet,Weishen Yang,Jürgen Caro
DOI: https://doi.org/10.1016/j.matlet.2005.06.067
IF: 3
2005-01-01
Materials Letters
Abstract:Phase structure and stability of three typical mixed ionic and electronic conducting perovskite-type membranes, SrCo0.8Fe0.2O3−δ (SCF), Ba0.5Sr0.5Co0.8Fe0.2O3−δ (BSCF) and BaCo0.4Fe0.4Zr0.2O3−δ (BCFZ) were studied by in situ high temperature X-ray diffraction at temperatures from 303 to 1273 K and under different atmospheres (air, 2% O2 in Ar and pure Ar) at 1173 K. By analyzing their lattice parameters the thermal expansion coefficients (TECs) of BSCF, SCF and BCZF are obtained to be 11.5×10−6 K−1, 17.9×10−6 K−1 and 10.3×10−6 K−1, respectively. A relationship between phase stability and TEC was proposed: the higher is the TEC, the lower is the operation stability of the perovskite materials.
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