Selective Field Evaporation in Field-Ion Microscopy for Ordered Alloys

XJ Ge,NX Chen,WQ Zhang,FW Zhu
DOI: https://doi.org/10.1063/1.369706
IF: 2.877
1999-01-01
Journal of Applied Physics
Abstract:Semiempirical pair potentials, obtained by applying the Chen-inversion technique to a cohesion equation of Rose et al. [Phys. Rev. B 29, 2963 (1984)], are employed to assess the bonding energies of surface atoms of intermetallic compounds. This provides a new calculational model of selective field evaporation in field-ion microscopy (FIM). Based on this model, a successful interpretation of FIM image contrasts for Fe3Al, PtCo, Pt3Co, Ni4Mo, Ni3Al, and Ni3Fe is given.
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