Abstract:In order to improve the reliability, operational readiness and system safety of equipment, testability should be seriously considered in the design stage. As an important part of design for testability, test sequence generation is a binary identification problem because a minimal expected cost testing procedure must be developed in order to determine the amount of possible failure sources, if any, are present. Many algorithms have been proposed, but the generation time is long or the test cost is high when dealing with a large-scale dependency matrix. To address this issue, we propose a general enhancement method based on the SVM, the ECA* and the Monte Carlo. It can be applied to any existing algorithm and can effectively improve the performance. The available tests are classed based on the SVM according to the information of nodes, the ECA* is used to cluster states, and the morpho-logical function of the test sequence is obtained through the Monte Carlo simulation. All this information is fused to dynamically adjust the scale of the dependency matrix and selected to modify the parameters. Experiments show that the existing algorithms have shorter calculation time and lower costs because the information is considered more comprehensively after enhancement.

Test generation algorithm for analog systems based on support vector machine

Improved Analogue Test Generation Algorithm Based on SVM

Test Generation Based on SVM for Analog System with a Multi-training Sets Method

An Algorithm of Soft Fault Diagnosis for Analog Circuit Based on the Optimized SVM by GA

A Parallel and Scalable Digital Architecture for Training Support Vector Machines

Power Transformer Fault Diagnosis Using Svm With Genetic Algorithms Optimization

Svm Method for Diagnosing Analog Circuits Fault Based on Testability Analysis

Research of fault diagnosis method of analog circuit based on improved support vector machines

Fault diagnosis method for analog circuit based on testability analysis and support vector machine

Analog Circuits Fault Diagnosis Based On Support Vector Machine

Analog Circuits Fault Diagnosis Using Support Vector Machine

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Fault Diagnosis Method for Analog Circuits Using Sensitivity Analysis and SVM

SVM Multi-classifier Design for Analogous Circuits Fault Diagnosis

Fault Diagnosis Of Circuits With Tolerance Based On Support Vector Machines

Analog circuit fault diagnosis using Ada Boost and SVM