Dependence of magnetic properties on the film thickness and Pt atomic fraction of post-annealed Fe1−xPtx-C granular films on MgO(100) and SiO2/Si(100) substrates

W.B. Mi,J. Jin,H.L. Bai

DOI: https://doi.org/10.1016/j.jallcom.2010.09.009

IF: 6.2

2011-01-01

Journal of Alloys and Compounds

Abstract:The Fe1−xPtx-C granular films with different Pt atomic fractions (0.09≤x≤0.52) and film thicknesses (5nm≤t≤100nm) were deposited on MgO(100) and SiO2/Si(100) substrates by facing-target sputtering and post-annealing. With the increasing x, the ordered L10 FePt grains form. All of the films are ferromagnetic, and the easy axis is in the film plane. With the decrease of t, the films turn from hard ferromagnetic to soft ferromagnetic. The maximum coercivity of the 100-nm thick Fe1−xPtx-C granular films measured at a 10-kOe field is 3.7kOe at x=0.48. The coercivity of the Fe0.56Pt0.44-C granular films increases, and the magnetization measured at a 10-kOe field decreases with the increasing t. The reversal mechanism of the 100-nm thick Fe1−xPtx-C granular films turns from the domain wall motion to the Stoner–Wohlfarth rotation mode as x increases. However, the reversal mechanism of the Fe56Pt44-C granular films with different t approaches the Stoner–Wohlfarth rotation mode, and is film-thickness independent.