Mechanism of interactions between fine particles

Hai-Liang ZHAO,Chang-Fu YOU,Hai-Ying QI,Xu-Chang XU
DOI: https://doi.org/10.3321/j.issn:0253-231X.2008.01.024
2008-01-01
Journal of Engineering Thermophysics
Abstract:The interactions between micron or near-submicron particles behaved as attracting- revolving-repulsing characteristics. The conventional inter-particle force model, including van der Waals force, Coulomb force and image force, could not explain these interaction behaviors. The forces between induced dipoles were proposed and added to modify the inter-particle force model. The simu- lations of particle interactions by the new force model agreed well with the experimental results. The analyses based on the new model showed that the influential parameters in the interactions included particle diameters, the initial relative locations, and the initial relative velocity. Applying external electrical field and inputting larger particles are the effective measures to enhance the aggregation of fine particles.
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