Abstract:Structure determination is a key application of XFELs and 4th generation synchrotron sources, particularly using the coherent and pulsed X-ray radiation from X-ray free-electron lasers (XFEL). Scientific interest focuses on understanding the physical, biological, and chemical properties of samples at the nanometer scale. The X-rays from XFELs enable Coherent X-ray Diffraction Imaging (CXDI), where coherent X-rays irradiate a sample, and a far-field diffraction pattern is captured by an imaging detector. By the nature of the underlying physics, the resolution, at which the sample can be probed with the CXDI technique, is limited by the wavelength of the X-ray radiation and the exposure time if a detector can record the diffraction pattern to very large scattering angles. The resolution that can be achieved under real experimental conditions, depends strongly on additional parameters. The Shannon pixel size, linked to the detector resolution, the coherent dose that can be deposited in the sample without changing its structure, the image contrast, and the signal-to-noise ratio of the detected scattered radiation at high $q$, i.e. at high scattering angles $2\Theta$, have a strong influence on the resolution. The signal-to-noise ratio at high $q$ defines the "effective" maximum solid angle in a specific experiment setup up to which a detector can efficiently detect a signal and in consequence determines the achievable resolution. The image contrast defines how well bright image features can be distinguished from dark ones. We present the preliminary results of our study on the influence of the PSF on SNR, image contrast, position resolution, and achievable sample resolution for different pixel sizes.

Effects of the Coherence of Illumination on Electron Microdiffraction Pattern Intensities.

Simulation of Ultrafast Electron Diffraction Intensity under Coherent Acoustic Phonons

Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

Applications of Microdiffraction Related to Hrem

Effect of antiphase domain boundaries on microdiffraction computer simulation

Electron Microscopy and Diffraction of Crystalline Dendrimers and Macrocycles

High-Resolution Scanning X-ray Diffraction Microscopy

On the damping of coherence in the small-angle inelastic scattering of high-energy electrons by crystals

On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging

Non-paraxial diffraction of tiny pinhole illuminated by partially coherent light

Evidence for the Damping of Coherence in Inelastic-Scattering of High-Energy Electrons by Crystals

Spectromicroscopy and coherent diffraction imaging: focus on energy materials applications

Observations of specimen morphology effects on near‐zone‐axis convergent‐beam electron diffraction patterns

Single electron self-coherence and its wave/particle duality in the electron microscope

Effect of spectral correlations on spectral switches in the diffraction of partially coherent light

Femtosecond mega-electron-volt electron microdiffraction

Pushing the limits of ultrafast diffraction: Imaging quantum coherences in isolated molecules

Analysis of diffraction imaging in non-conjugate configurations.

Electron diffraction based techniques in scanning electron microscopy of bulk materials

Synergistic Effects of Anisotropy and Image Force on TEM Diffraction Contrast of Dislocation Loops

Diffraction contrast in reflection electron microscopy—I. Screw dislocation