Temperature measurement on moving shock wave by two-wavelength NO-PLIF method

CAO Chunli,XU Shengli,LIU Erwei
DOI: https://doi.org/10.3969/j.issn.0253-2778.2012.12.005
2012-01-01
Journal of University of Science and Technology of China
Abstract:Experiments were conducted in the shock tube on temperature measurements with the two-line NO-PLIF technique.NO was selected as the tracer and exciting wavelengths were 225.072 nm and 225.282 nm,respectively.Temperatures in Zone 1 and Zone 2 of the incident shock wave were theoretically estimated and experimentally measured.The results show that the intensity of fluorescence strongly depends on temperature when the exciting wavelength is 225.282 nm,but the dependence is not so strong when the exciting wavelength is 225.072 nm.The error relative to the theoretically estimated value is about 10%,which implies the practicability and reliability of the NO-PLIF system.
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