Probing Layer Number and Stacking Order of Few-Layer Graphene by Raman Spectroscopy.

Yufeng Hao,Yingying Wang,Lei Wang,Zhenhua Ni,Ziqian Wang,Rui Wang,Chee Keong Koo,Zexiang Shen,John T. L. Thong
DOI: https://doi.org/10.1002/smll.200901173
IF: 13.3
2010-01-01
Small
Abstract:Layer number and stacking order of few-layer graphene (FLG) are of particular interest since they directly determine the performance of graphene-based electronic devices. By analyzing Raman spectra and Raman images, quantitative indices are extracted to discriminate the thickness of AB-stacked FLG from single- to five-layer graphene; a few key spectral characteristics are also identified for FLG with misoriented stacking.
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