STM/AFM study of grain boundary migration in nanostructured solids

J.Y. Ying,Wang Guang-Hou,H. Fuchs,R. Laschinski,H. Gleiter
DOI: https://doi.org/10.1016/0167-577X(92)90141-6
IF: 3
1992-01-01
Materials Letters
Abstract:Nanostructured materials were directly imaged by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Images suggested that nanostructured palladium (Pd) consisted of equiaxed crystals of ≈ 10 nm diameter joined together by grain boundaries. Migration of the grain boundaries in nanostructured Pd was stimulated by STM (but not AFM), resulting in a preferential alignment of the nanometer-sized grains.
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