Fast Floating Random Walk Algorithm Formulti-Dielectric Capacitance Extraction with Numerical Characterization of Green's Functions

Hao Zhuang,Wenjian Yu,Gang Hu,Zhi Liu,Zuochang Ye
DOI: https://doi.org/10.1109/aspdac.2012.6164977
2012-01-01
Abstract:The floating random walk (FRW) algorithm has several advantages for extracting 3D interconnect capacitance. However, for multi-layer dielectrics in VLSI technology, the efficiency of FRW algorithm would be degraded due to frequent stop of walks at dielectric interface and constraint of first-hop length especially in thin dielectrics. In this paper, we tackle these problems with the numerical characterization of Green's function for cross-interface transition probabilities and the corresponding weight value. We also present a space management technique with Octree data structure to reduce the time of each hop and parallelize the whole FRW by multi-threaded programming. Numerical results show large speedup brought by the proposed techniques for structures under the VLSI technology with thin dielectric layers.
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