Modeling and simulation on the magnetization in field-cooling and zero-field-cooling processes

S.L Li,H.H Wen,Z.X Zhao
DOI: https://doi.org/10.1016/S0921-4534(99)00262-2
1999-01-01
Abstract:By using Monte Carlo simulation and thermally activated flux motion (TAFM) model, we calculate the magnetic field profile and thus the magnetization in the field-cooling (FC) and zero-field-cooling (ZFC) processes. Based on the simple Kim-Anderson U(j) dependence, the major experimental observations can be nicely reproduced. It is found that the calculated field profile B(x) is close to the Bean critical state model in the ZFC process, in sharp contrast to that in the FC: process which shows a curved frozen flux pattern. The magnetization in both the ZFC and FC processes is strongly dependent on the pinning potential and the critical current density, but weakly dependent on the temperature-sweeping rate. (C) 1999 Elsevier Science B.V. All rights reserved.
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