Structural fabrication and defect-dependent optical transmission of dielectric multilayer films

Z. Wang,R.W. Peng,F. Qiu,Z.H. Tang,X.F. Hu,X.Q. Huang,Mu Wang,A. Hu,S.S. Jiang,D. Feng
DOI: https://doi.org/10.1016/j.jcrysgro.2004.11.142
IF: 1.8
2005-01-01
Journal of Crystal Growth
Abstract:We present the structural fabrication and the optical transmission of dielectric multilayer films with a defect both theoretically and experimentally. With the transfer-matrix method, the transmission of electromagnetic waves through the multilayer can be theoretically analyzed. It is shown that a defect layer in the structure can induce the localized mode that is shown as the transmission peak in the photonic band gap (PBG). Both the intensity and the quality factor of the peak definitely change with adjusting the position of the defect in the multilayer. Further, the number of transmission peaks in the PBG can be tuned by changing the thickness of the defect layer. In the experiment, a series of TiO2/SiO2 multilayer films with the defect layer HfO2 have been fabricated using the electron-gun evaporation technique. Optical measurements are in good agreement with theoretical predictions. The investigation achieves the possible application to the wavelength division multiplexing system. (C) 2004 Elsevier B. V. All rights reserved.
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