Automatic Defect Segmentation in X-Ray Images Based on Deep Learning
Wangzhe Du,Hongyao Shen,Jianzhong Fu
DOI: https://doi.org/10.1109/tie.2020.3047060
IF: 7.7
2021-12-01
IEEE Transactions on Industrial Electronics
Abstract:X-ray imaging has been broadly adopted as a nondestructive testing method for product quality inspection. Deep learning has demonstrated powerful image scene understanding capabilities. In this article, U-Net with resnet101 is taken as the baseline for defect segmentation. First, there exist gray inhomogeneous and low-contrast regions in X-ray images, which can hardly be segmented. Contrast-limited adaptive histogram equalization (CLAHE) could be used to improve the contrast and consistency of the X-ray image. A two-stream convolutional neural network (CNN) is proposed that takes the original image and CLAHE processed image as inputs to address this issue. And then in CNN, low-level feature maps are lacking semantic information, which may lead to worse results. A gated multilayer fusion module is proposed to adaptively fuse the high-level features into low-level features. Furthermore, loss functions (such as cross entropy) in semantic segmentation are usually pixel level, ignoring the regional information. A weighted intersection over union (IOU) loss function is proposed to introduce IOU information to guide the model to focus on the objects that are easy to mine. The experimental results prove that the three proposed methods have better performance than the baseline for our dataset, achieving 42.2 in mIoU, 59.2 in Dice, and 54.5%, 74.9%, and 86.3% in small, middle, and large object recall rate, respectively.
automation & control systems,engineering, electrical & electronic,instruments & instrumentation