Improvement of Analog Circuit Testability Analysis Based on Symbolic Method

Zheng Zhigang
DOI: https://doi.org/10.16526/j.cnki.11-4762/tp.2012.09.024
2012-01-01
Abstract:Testability is an important concept in circuit test and fault diagnosis field,and it is a quantity measure of test node selection.Symbolic method is used to evaluate circuit testability.To resolve the problem that the symbolic method can't apply to the diagnosis equation whose coefficient of the item with highest power in the denominator is not equal to 1,a new method is proposed to transform the original diagnosis equation into a new one,which is then used to evaluate the circuit testability.The example circuit analysis shows that the improved method can do with any form fault diagnosis equation,it eliminates error introduction during calculation and has the feature of simple and accurate.
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