Theoretical electron energy-loss spectroscopy and its application in materials research.

Jing Zhu,Shang-Peng Gao,Ai-Hua Zhang,Jun Yuan
DOI: https://doi.org/10.1093/jmicro/dfi041
2005-01-01
Microscopy
Abstract:Electron energy-loss near-edge fine structure (ELNES) of group-III nitrides is calculated using a pseudopotential plan wave method within the framework of density functional theory. Core-hole effect and supercell size influence are investigated. Based on our present and earlier work, a comprehensive understanding of theoretical ELNES application in materials research is demonstrated: interpreting ...
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