Abstract:The estimation of the parameters of a sinusoidal signal is of paramount importance in various applications in the fields of sensors, signal processing, parameter estimation, and device characterization, among others. The presence, in the measurement system, of non-ideal phenomena such as additive noise in the signals, phase noise in the stimulus generation, jitter in the sampling system, frequency error in the experimental setup, among others, leads to increased uncertainty and bias in the estimated quantities obtained by least squares methods and those derived from them. Therefore, from a metrological point of view, it is important to be able to theoretically predict and quantify those uncertainties in order to properly design the measurement system and its parameters, such as the number of samples to acquire or the stimulus signal amplitude to use to minimize the uncertainty in the estimated values. Previous works have shown that the presence of these non-ideal phenomena leads to increased uncertainty and bias in the estimation of the sinewave amplitude. The present work complements this knowledge by focusing specifically on the effect of phase noise and sampling jitter in the bias of the initial phase estimation of a sinusoidal signal of known frequency (three‐parameter sine fitting procedure). A theoretical derivation of the bias of initial phase estimation that takes into consideration the presence of phase noise in the sinewave is presented. Since a Taylor series approximation was used where only the first term was retained, it was necessary to validate the analytical derivations with numerical simulations using a Monte Carlo type of procedure. This process was applied to different conditions regarding the phase noise standard deviation, initial phase value, and number of samples. It is concluded that, in most scenarios, initial phase estimation using sine fitting is unbiased in the presence of phase noise or jitter. It is shown, however, that in cases of extremely high phase noise standard deviation and a very low number of samples, a bias occurs.

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