An Important Mechanism of Crop Breeding with Ultralow Energy Ion Implantation

ZQ Wei,GW Han,GM Zhou,Q Li,HM Xie,QX Gao
DOI: https://doi.org/10.1016/s0168-583x(98)00507-2
1998-01-01
Abstract:The characteristic X-rays excited in carbon compounds of seeds by ultralow energy (110 keV) ions implanted in wheat seeds were simulated with carbon-light of synchrotron-radiation. After the seeds were irradiated with the C-light, the through-germination survival fraction of the seeds and the micronucleus frequency in their root-tip cells could be measured. The data verify that the characteristic X-rays excited by the ultralow energy ions implanted in the seeds provide an important mechanism of crop breeding.
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