Neural Network Algorithm of VLSI Fault-Tolerant Array Using Single-Track Switches

CHEN Mao,GAO Lin
DOI: https://doi.org/10.3969/j.issn.1006-9348.2006.07.040
2006-01-01
Abstract:In order to solve the problem of low yield caused by the defects in VLSI manufacture,we usually employ two approaches for redundant VLSI array reconfiguration or degradable VLSI array reconfiguration.Both approaches are proved NP-hard.The paper will get a redundant repair method to solve the problem.It's based on the model of Hopfield neural network,changing the problem of array reconfiguration into the problem of maximum independent set of contradiction graph.Through the energy function of Hopfield neural network,it will be easy to find reasonable path to solve the problem.It is proved by experiment to be a simple and useful method.
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