Inversion of Lunar Regolith Layer Thickness Using Microwave Radiance Simulation of Three Layer Model and Clementine UV-VIS Data

FA Wenzhe,JIN Yaqiu
DOI: https://doi.org/10.11728/cjss2007.01.055
2007-01-01
Chinese Journal of Space Science
Abstract:A correspondence of the lunar regolith layer thickness to the lunar Digital Elevation Mapping(DEM)is proposed to construct the global distribution of lunar regolith layer thickness. Using Clementine UV-VIS multispectral data,the global spatial distribution of FeO+TiO_2 content on the lunar regolith layer is calculated.Thus,dielectric permittivity of global lunar regolith layer can be obtained.Based on some measurements of physical temperature of the lunar surface,an empirical formula of physical temperature distribution over the lunar surface is presented.Based on aforementioned works,brightness temperature of lunar regolith layer in passive microwave remote sensing,which is planned for Chinese Chang-E lunar project,is numerically simulated by a three layer model using fluctuation dissipation theorem.Taking these simulations with random noise as observations,an inversion approach of the lunar regolith layer thickness is developed.Physical tem- perature of the top layer and the lower regolith can be inverted by the brightness temperature at high frequency channels using a two-layer model.The regolith layer thickness can be finally inverted by the brightness temperature at low frequency channel.Inversion error is also discussed.Numerical simulation and inversion approach in this paper make an evaluation of the performance for lunar passive microwave remote sensing,and can be applied to future data calibration and validation.
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