Multi-label semi-supervised learning method learnt from Hilbert-Schmidt independence criterion

Zhang Chenguang,Zhang Yan,Zhang Xiahuan
DOI: https://doi.org/10.3969/j.issn.2095-2783.2013.10.011
2013-01-01
Abstract:Hilbert-Schmidt independence criterion(HSIC)can be used to measure the correlation degree of feature set and label set of samples.On the basis of HSIC,this paper presents a new semi-supervised learning method called dependence maximization multi-label semi-supervised learning method(DMMS).By setting the existing labels as constraint and dependence of features and labels as optimization objective,the method solves a linear system to get the labels for unlabeled samples,possessing the features of simple implementation and no parameter estimation.Experiments on some real multi-label datasets show that the proposed method is as good as the state-of-the-art multi-label learning methods in recognition tasks,including multi-label k-nearest neighbor(MLKNN)and graph based semi-supervised learning method.
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