Fault Diagnosis Base on SDG Combined with KPCA-MSPC

CHEN Chen,XIONG Zhi-hua,LV Ning,WANG Xiong
DOI: https://doi.org/10.3969/j.issn.2095-6835.2010.28.040
2010-01-01
Abstract:The model-based signed digraph(SDG) method has been widely used in process industry for its completeness and deep inference.However,it is very difficult to select the thresholds of the nodes.In this paper,by combing SDG with kernel principal component analysis(KPCA) and multivariable statistical process control(MSPC) based on historical data,a new approach is presented to overcome the disadvantage of SDG in threshold selection.The simulation results on the platform of Tennessee Eastman(TE) process show that the efficiency of the proposed approach.
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