Measurements of Displacement and Trapping Force on Micron-Sized Particles in Optical Tweezers System

Honglian Guo,Xincheng Yao,Zhaolin Li,Bingying Cheng,Xuehai Han,Daozhong Zhang
DOI: https://doi.org/10.1360/02ys9101
2002-01-01
Science China Mathematics
Abstract:A high-stability optical tweezers equipped with a high-precision measurement system of displacement and force is set up. The results show that this combination can be used to carry out quantitative measurements of small displacements and forces for micron-sized spheres. The precision of measurements has reached nanometers and piconewtons, respectively.
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