An International Comparative Study on Development Pattern of Nanotechnology Through Patent-based Cross Impact Analysis

MA Rong-kang,LIU Feng-chao
DOI: https://doi.org/10.3969/j.issn.1002-9753.2012.12.005
2012-01-01
Abstract:Take advantage of IPC and technology field information of patents,this paper constructs a framework for analyzing the interaction among different technology fields in nanotechnology based on cross impact analysis.We make a comparative study on development pattern of nanotechnology in U.S.,Japan,Germany and South Korea based on patent data of USPTO,and then we discuss the development status of nanotechnology in China;finally,we provide some policy implications for China's development strategy in nanotechnology.
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