Abstract:Abstract Surface-mount device light emitting diode (SMD-LED) is characterized by small size, wide viewing angle and light weight. It becomes the main package type of LED gradually. The traditional visual inspection is likely to cause misrecognition due to personal subjectivity and different defect recognition standards. Therefore, this study develops an automatic SMD-LED defect detection system, which is characterized by non-contact inspection, defect recognition standardization and upgrading product quality. It detects the common and important defects in LED package components, including missing component, no chip, wire shift and foreign material. In this study the gray scale characteristic of histogram is used as the rapid sieving analysis indicator of missing component defect, and then the component and solder joint are positioned by using fast normalized cross-correlation, and the maximum correlation coefficient value is used as judgment indicator of no chip defect. In order to overcome the difficult identification as the weld line is subject to light rays, the improved Michelson-like contrast (MLC) enhancement is proposed, and the segmentation threshold is selected by entropy information to segment the weld line successfully. Furthermore, in order to overcome the effect of the tolerance of component size and internal electrode and unfixed weld line position resulted from lead frame process on foreign material detection result, the multiscale adaptive Fourier analysis (MAFA) is proposed in the concept of texture anomaly detection for foreign material defect detection. The result proves that the proposed method can segment the defect effectively and correctly compared with the phase-only transform (PHOT) and multiscale phase-only transform (MPHOT), and it can be used in other fields of texture anomaly detection. The overall recognition rate of this system is 98.25%, contributing to the large market demand and high component quality of LED industry.

A fast detecting algorithm for surface mount devices based on complex moment.

A New Detecting Algorithm for Chip Based on B-spline Wavelet

A Fast Method for Detecting and Locating BGA Based on Twice Grading and Linking Technique

Research on Ultrasonic Detection of Complex Surfaces

Program Realization of High-speed and High-precision Surface Mounting System Based on Vision

Precise Positioning of Circular Mark Points and Transistor Components in Surface Mounting Technology Applications

A Novel Industrial Chip Parameters Identification Method Based on Cascaded Region Segmentation for Surface-Mount Equipment

A fast non-destructive defect detection method for complex PCB surfaces

Reference-Free Path-Walking Method for Ball Grid Array Inspection in Surface Mounting Machines.

A Line-Based-Clustering Approach for Ball Grid Array Component Inspection in Surface-Mount Technology.

A Fast Center Detecting Method Based on Improved Randomized Hough Transform

Fast Centroid Algorithm for Determining the Surface Plasmon Resonance Angle Using the Fixed-Boundary Method

A Method for Wafer Defect Detection Using Spatial Feature Points Guided Affine Iterative Closest Point Algorithm.

Automated visual inspection of surface mounted chip components

Detection of small surface defects based on machine vision

Anomaly Detection in Surface Mount Technology Process Using Multi-Modal Data: Poster Abstract

Automated optical inspection system for surface mount device light emitting diodes

Method of detection for complex surfaces based on industrial close-range photogrammetry

Fast detection of circular pcb mark using Hough transform

Developing a surface mount technology defect detection system for mounted devices on printed circuit boards using a MobileNetV2 with Feature Pyramid Network

Efficient and Precise Detection of Surface Defects on PCBs: A YOLO Based Approach.