Technology of drawing dynamic wave in test instrument

Yang Le,Wang Houjun,Dai Zhijian
DOI: https://doi.org/10.3321/j.issn:0254-3087.2006.z2.054
2006-01-01
Abstract:The drawing of dynamic wave is very important in test instrument. Some technologies in drawing the dynamic wave of test instrument under the Windows environment will be introduced in this paper, which include the two-buffer technology, multi-image superimposition technology, image duplicate using technology. With these technologies drawing dynamic wave, can eliminate the 'screen flicker' phenomenon, and can accelerate the speed of drawing.
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