Edge Effect in Spatial Point Pattern Analysis and Monte Carlo Simulations on Two Correction Methods

Zhang Zhijie,Peng Wenxiang,Zhou Yibiao
2008-01-01
Abstract:Objective To introduce the concept of edge effect,conduct comparisons on two correction methods,and provide a practical direction on doing spatial point pattern analysis.Methods The concepts of K function and edge effect,and the theories of buffer zone method and weighted correction method were first introduced.Then Matern inhibition point process,Poisson point process,and Neyman-Scott point process were accepted to simulate three different spatial point patterns on the unit square of (0,1)×(0,1),whose densities were 10,100,500,and 1 000 respectively.Finally,K function was chosen as the statistic to show the impact of edge effect on the results and compare the results of two different correction methods.Results Edge effect was small and needn't to be corrected for a point process of low density,but it was large and must be corrected for a point process with high density.If the study scale was small,both weighted correction method and buffer zone method were very good and their results were similar,but weighted correction method was better than buffer zone method for the larger study scale.Conclusion Weighted correction method could be used to conduct spatial point pattern analysis for reliable and precise results.
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