Advances on the Research of Scan Blindness Elimination in Phased Array

唐明春,肖绍球,王秉中,刘元柱
DOI: https://doi.org/10.3969/j.issn.1673-5048.2010.03.005
2010-01-01
Abstract:Physical mechanism of the Scan blindness occurrence in microstrip phased array is analyzed deeply,and its influence on scanning performance of phased microstrip array is also discussed.According to the necessary conditions of the scan blindness occurrence,general conditions of research and development in scan blindness elimination is retrospected and concluded,which include loading subarrays,EBGs,DGSs and metamaterials.
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