A Universal Test System Framework and Its Application on Satellite Test.
Xiuhai Cui,Yu Peng,Xiyuan Peng
DOI: https://doi.org/10.1145/3093241.3093256
2017-01-01
Abstract:to improve the universal of the test system, save the test cost and reduce the tester development time, this paper proposes a universal test system framework which is composed of four layers which are user layer, API (Application Program Interface) layer, IVI-COM layer, and hardware layer. The test framework efficiently combines the IVI-COM interchangeability and FPGA reconfigurability. The both combination can improve the test system's scalability and versatility. To improve the universal of the test system, a universal model is designed for different types of switches. Based on this module, back-tracking algorithm is selected to find a path between different ends of the switch. This search method can quickly find the path and solve the problem of which the configurable channel is occupied by another path. This model allows designing a driver suitable for different switches. It reduces the workload of the instrument of manufacture. With this kind of test framework, in one IDEs (intergraded development Environments), we design and develop different test system for satellite. One is PXI (PCI eXtensions for Instrumentation) test system, the other is VXI (VME eXtensions for Instrumentation) test system. The experiment results show the PXI system and VXI test system both work correctly in ground satellite test. The switch modules embody a good interchangeability, the communication modules reflect a good reconfiguration. The combination of interchangeability and reconfigurability of test system can effective reduce the tester development time, save the test cost, and improve the universal of the test system.