Abstract:Accelerated life testing is adopted in several fields to obtain adequate failure time data of test units in a much shorter time than testing at normal operating conditions. The lifetime of a product at constant level of stress is assumed to have an exponentiated Lindley distribution. In this paper, besides maximum likelihood method, eight other frequentist methods of estimation, namely, method of least square estimation, method of weighted least square estimation, method of maximum product of spacing estimation, method of minimum spacing absolute distance estimation, method of minimum spacing absolute-log distance estimation, method of Cramér-von-Mises estimation, method of Anderson-Darling estimation and Right-tail Anderson-Darling estimation are considered to estimate the parameters of the exponentiated Lindley distribution under constant stress accelerated life testing. Moreover, shape parameter and the reliability function under usual conditions are estimated based on aforementioned methods of estimation. To evaluate the performance of the proposed methods, a simulation study is carried out. The performances of the estimators have been compared in terms of their mean squared error using small, medium and large sample sizes. As an illustration, the model and the proposed methods are applied to two accelerated life test data sets.

Optimal Multiple Constant-Stress Accelerated Life Tests for Generalized Exponential Distribution

Optimum Constant-Stress Accelerated Life Tests with Competing Causes of Failure under Exponential Distribution

Optimal Step-Stress Test under Type-I Censoring for Multivariate Exponential Distribution

Interval estimation of the two-parameter exponential constant stress accelerated life test model under Type-II censoring

Generalized inverted exponential distribution under constant stress accelerated life test: Different estimation methods with application

Optimum Simple Constant-Stress Accelerated Life Tests with Competing Causes of Failure

Optimal Constant-Stress Accelerated Life Test Plans for One-Shot Devices with Components Having Exponential Lifetimes under Gamma Frailty Models

Statistics Analysis for the Circular-Progressive-stress Life Tests under Generalized Exponential Distribution

Optimal Design Of Accelerated Life Testing With Multiple Estimation Objectives Using Log-Normal Distribution

Statistical Analysis of Constant Stress Accelerated Life Testing with Exponential Distribution under Progressive Type-Ⅱ Censoring

Designing Adaptive Accelerated Life Tests Using Bayesian Methods

Analysis for constant-stress model on multicomponent system from generalized inverted exponential distribution with stress dependent parameters

Classical methods of estimation on constant stress accelerated life tests under exponentiated Lindley distribution

A Generalized Linear Model Approach to Designing Accelerated Life Test Experiments

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Bayesian Planning of Optimal Step-Stress Accelerated Life Test for Log-Location-scale Distributions

Accelerated Life Testing──Circular-Progressive-Stress Models and Data Analyses

Optimum Design of Accelerated Life Test Plan on non-rectangle Test Region Based on Uniform Design Theory

Optimal Design for Constant-Stress Accelerated Degradation Test Based on Gamma Process

The Step-stress Life-testing with Random Stress-change Times under Exponential Distribution

STATISTICAL ANALYSIS OF PROGRESSIVE STRESS ACCELERATED LIFE TESTING OF WEIBULL DISTRIBUTIONS UNDER CE MODEL