Positron Annihilation Study on ZnO-based Scintillating Glasses

Jiaxiang Nie,Runsheng Yu,Baoyi Wang,Yuwen Ou,Yurong Zhong,Fang Xia,Guorong Chen
DOI: https://doi.org/10.1016/j.apsusc.2009.02.038
IF: 6.7
2009-01-01
Applied Surface Science
Abstract:Positron lifetime of ZnO-based scintillating glasses (55−x)SiO2–45ZnO–xBaF2 (x=5, 10, 15mol%) were measured with a conventional fast–fast spectrometer. Three positron lifetime components τ1, τ2, and τ3 are ∼0.23ns, ∼0.45ns, and ∼1.6ns, respectively. All the three positron lifetime components first increase with increasing BaF2 concentration from 5mol% to 10mol%, then decreases as BaF2 further increases to 15mol%. The result suggests that the glass sample with 10mol% BaF2 contains the highest defect density, and is in excellent agreement with glass chemistry, glass density, thermal properties, and calculated crystallinity. Therefore, positron annihilation lifetime measurement is an effective tool for analyzing defects in ZnO-based scintillating glasses.
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