Pattern Classification Based on K Locally Constrained Line

Jianjun Qing,Hong Huo,Tao Fang
DOI: https://doi.org/10.1007/s00500-010-0602-2
IF: 3.732
2010-01-01
Soft Computing
Abstract:A simple yet effective learning algorithm, k locally constrained line ( k -LCL), is presented for pattern classification. In k -LCL, any two prototypes of the same class are extended to a constrained line (CL), through which the representational capacity of the training set is largely improved. Because each CL is adjustable in length, k -LCL can well avoid the “intersecting” of training subspaces in most traditional feature classifiers. Moreover, to speed up the calculation, k -LCL classifies an unknown sample focusing only on its local CLs in each class. Experimental results, obtained on both synthetic and real-world benchmark data sets, show that the proposed method has better accuracy and efficiency than most existing feature line methods.
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