Transmission Bandwidth of 3-Wire Synchronous Serial Port Based on LVDS

WANG Wen-hua,HE Bin,REN Jian-yue
DOI: https://doi.org/10.3788/yjyxs20112603.0344
2011-01-01
Abstract:This paper tries to exam the transmission bandwidth by establishing a scientific test-platform.The paper provides a test pattern formed by 10 bit raw image data which is generated by FPGA as transmitter.The receiver performs data conversion serial-to-parallel and then sends image data as well as clock and enable signals to the image grabber.The transmission reliability is estimated by checking the real-time received test pattern through the 3-wire LVDS serial port.From abundant experiments,the paper gets two results: when LVDS is implemented by imbedding modules in FPGA,transmission bandwidth is approx 152 Mbit/s;when LVDS is implemented by special LVDS devices,transmission bandwidth is approx 125.2 Mbit/s.In practical application cases,bandwidth derating is advised.
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