A Mono-Metal-Wire Pressure Measuring Technology for Low Pressure Package of MEMS Devices

ZHANG Min,GAN Hua,GUAN Yong,MIAO Min,JIN Yufeng
DOI: https://doi.org/10.3969/j.issn.1005-9490.2013.05.004
2013-01-01
Abstract:A mono-metal-wire Pirani gauges for low pressure testing of MEMS small cavity is proposed. With CFDACE + software,modeling and simulation of these Pirani gauges have been carried out. The pressure tests and calibrations have been done using wires of different sizes and materials based on four-probe method. The test results show that 1 Pa ~ 1 000 Pa pressure measurement within the MEMS device packaging can be achieved by using mono-metal-wire structure such as Platinum wires. Within the testing range of pressure,the smaller the diameter of wire and the longer the length of wire and the greater the load of current is,the higher the sensitivity of Pirani gauges will be.
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