Study on the Reflection of EM Wave from Chiral Material

GQ Wang,P Zhang,ZL Liu,KL Yao
DOI: https://doi.org/10.1016/j.apsusc.2003.09.047
IF: 6.7
2003-01-01
Applied Surface Science
Abstract:We measured the reflection for six chiral samples with helix percentage of volume ranging from 0.4 to 6.4%. The normally incident wave is linearly polarized. Experiment results indicate that the heliex percentage of volume can be used as a sensitive parameter to control electromagnetic wave characteristics in chiral material. Discussion to experimental results is given.
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