The Design of Distributed Hardware Platform for Complex Electronic System Testing
Chang'an Wei,Gang Wang,Yunlong Sheng,Shouda Jiang,Xiangyu Tian
DOI: https://doi.org/10.1007/978-3-319-50212-0_33
2017-01-01
Abstract:Due to complex interface in the complex electronic system which contains embedded software, such as RS422, CAN, analog and digital input/output interface. In addition, embedded software in complex electronic system usually controls a large number of peripherals, there are usually no enough external test resources in one computer, according to this problem, we provide distributed structure to construct the software testing system. In hardware, a high-speed information transmission mechanism based on memory reflective technique is studied, and a multi-functional reflective memory communication cards is developed, using optical fiber to form a high speed data transmission network, realizing automatic data input and test result obtain.