Ultrafast formation of topological defects in a two-dimensional charge density wave
Yun Cheng,Alfred Zong,Lijun Wu,Qingping Meng,Wei Xia,Fengfeng Qi,Pengfei Zhu,Xiao Zou,Tao Jiang,Yanfeng Guo,Jasper van Wezel,Anshul Kogar,Michael W. Zuerch,Jie Zhang,Yimei Zhu,Dao Xiang
DOI: https://doi.org/10.1038/s41567-023-02279-x
IF: 19.684
2024-01-05
Nature Physics
Abstract:Topological defects play a central role in dynamical systems undergoing a non-adiabatic transition. In solids, topological defects as a result of femtosecond laser excitation have attracted increasing interest not only because they are key to understanding phase transitions but also because they can generate a variety of hidden orders that are not accessible in thermal equilibrium. Despite the common occurrence of these defects in a non-equilibrium system, the fundamental limit on how fast they can emerge in solids and the generic pathway for defect creation at such fast timescales have remained open questions. Here we apply ultrafast electron diffraction to study the reciprocal-space signatures of transient defects in a two-dimensional charge density wave, where simultaneous measurements of both defect and phonon dynamics yield a microscopic view of defect formation in the femtosecond regime. We find that one-dimensional domain walls are generated well within 1 ps following photoexcitation, during which the defect growth is not dictated by the amplitude of the order parameter, but is mediated by a non-thermal population of longitudinal optical phonons. Our work provides a framework for the ultrafast engineering of topological defects that are coupled to specific collective modes, which will prove useful for the dynamical control of non-equilibrium phases in correlated materials.
physics, multidisciplinary