One-dimensional Topological Defect Observed in Ni-Mo Amorphous Films

CH SHANG,BX LIU,HD LI
DOI: https://doi.org/10.1103/physrevb.44.7302
1991-01-01
Abstract:When as-vitrified Ni-Mo films are irradiated to a critical dose by 200-keV xenon ions at room temperature, many fine enclosed curves with widths in the range 2-15 nm are observed in an amorphous matrix by transmission electron microscopy. The enclosed curves are attributed to one-dimensional topological defects in amorphous solids. Rich microstructures pertinent to the line defect are described in detail, and elucidated in terms of the elastic theory of continuum media.
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