Histogram Similarity Measure Using Variable Bin Size Distance

Yu Ma,Xiaodong Gu,Yuanyuan Wang
DOI: https://doi.org/10.1016/j.cviu.2010.03.006
IF: 4.886
2010-01-01
Computer Vision and Image Understanding
Abstract:In order to improve the performance of bin-by-bin distances, this paper proposes variable bin size distance (VBSD) as the histogram similarity measure. It calculates the histogram distance in a fine-to-coarse way, and can be considered as a cross-bin extension for bin-by-bin distances. The VBSD can be used to measure the similarity of multi-dimensional histograms, and is insensitive to both the histogram translation and the variation of histogram bin size. Experimental results show that the variable bin size distance performs better than bin-by-bin distances in the image retrieval applications.
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