Abstract:It remains a tough task for designing a microscopy system to approach the diffraction limit over a wide field of view due to its restricted space bandwidth product (SBP). Fourier ptychographic microscopy (FPM) has been developed to broaden the SBP of a conventional microscope platform without major hardware modifications. In this paper, we propose a novel FPM system based on the phase-coded speckle illumination, termed PSI-FPM, which employs a laser source with a speckle illumination control optical system. A phase-only spatial light modulator (SLM) with a condenser lens is utilized in the PSI-FPM system to project the phase-coded speckle illumination patterns onto the sample. The convolution between the sample spectrum and the illumination spectrum in the Fourier domain extend the numerical aperture of the objective that acts as a low-pass filter with cut-off frequency. The SLM is introduced in the PSI-FPM system to produce the specific illumination patterns so that the number of the captured images used for reconstruction are greatly reduced. In addition, the generated pattern is scanned to different directions without mechanical movement, which improves the robustness of the system. The PSI-FPM system is validated against simulations and experiments, and as a result reconstructs high-resolution images once the phase retrieval algorithm is employed. We envision that the PSI-FPM system will be suitable for many other speckle imaging applications.

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